ORCA Series 4
Product Brief
Field-Programmable Gate Arrays
January 15, 2002
Programmable Features (continued)
Improved built-in clock management with program-
mable phase-locked loops (PPLLs) provide optimum
New capability to (de)multiplex I/O signals:
— New double data rate on both input and output at
rates up to 350 MHz (700 MHz effective rate).
— New 2x and 4x downlink and uplink capability per
I/O (i.e., 50 MHz internal to 200 MHz I/O).
clock modi ? cation and conditioning for phase, fre-
quency, and duty cycle from 20 MHz up to 420 MHz.
Multiplication of the input frequency up to 64x, and
division of the input frequency down to 1/64x, is pos-
sible.
Enhanced twin-quad programmable function unit
(PFU):
— Eight 16-bit look-up tables (LUTs) per PFU.
— Nine user registers per PFU, one following each
LUT and organized to allow two nibbles to act
independently, plus one extra for arithmetic opera-
tions.
— New register control in each PFU has two inde-
pendent programmable clocks, clock enables,
local set/reset, and data selects.
— New LUT structure allows ? exible combinations of
LUT4, LUT5, new LUT6, 4 to 1 MUX, new
8 to 1 MUX, and ripple mode arithmetic functions
in the same PFU.
— 32 x 4 RAM per PFU, con ? gurable as single- or
dual-port. Create large, fast RAM/ROM blocks
(128 x 8 in only eight PFUs) using the SLIC
decoders as bank drivers.
New 200 MHz embedded quad-port RAM blocks,
two read ports, two write ports, and two sets of byte
lane enables. Each embedded RAM block can be
con ? gured as:
— 1-512 x 18 (quad-port, two read/two write) with
optional built in arbitration.
— 1-256 x 36 (dual-port, one read/one write).
— 1-1K x 9 (dual-port, one read/one write).
— 2-512 x 9 (dual-port, one read/one write for each).
— 2 RAMS with arbitrary number of words whose
sum is 512 or less by 18 (dual-port, one read/one
write).
— Supports joining of RAM blocks.
— Two 16 x 8-bit content addressable memory
(CAM) support.
— FIFO 512 x 18, 256 x 36, 1K x 9 or dual 512 x 9.
— Constant multiply (8 x 16 or 16 x 8).
— Dual-variable multiply (8 x 8).
— Soft-wired LUTs (SWL) allow fast cascading of up
to three levels of LUT logic in a single PFU
through fast internal routing, which reduces rout-
ing congestion and improves speed.
— Flexible fast access to PFU inputs from routing.
— Fast-carry logic and routing to all four adjacent
PFUs for nibble-, byte-wide, or longer arithmetic
functions, with the option to register the PFU
carry-out.
Abundant high-speed buffered and nonbuffered rout-
ing resources provide 2x average speed improve-
ments over previous architectures.
Embedded 32-bit internal system bus plus 4-bit par-
ity interconnects FPGA logic, microprocessor inter-
face (MPI), embedded RAM blocks, and embedded
standard cell blocks with 100 MHz bus performance.
Included are built-in system registers that act as the
control and status center for the device.
Built-in testability:
— Full boundary scan ( IEEE ? 1149.1 and Draft
1149.2 joint test access group (JTAG)).
— Programming and readback through boundary
scan port compliant to IEEE Draft 1532:D1.7.
— TS_ALL testability function to 3-state all I/O pins.
Hierarchical routing optimized for both local and glo-
— New temperature-sensing diode.
bal routing with dedicated routing resources. This
results in faster routing times with predictable and
ef ? cient performance.
New cycle stealing capability allows a typical 15% to
40% internal speed improvement after ? nal place
and route. This feature also enables compliance with
SLIC provides eight 3-statable buffers, up to 10-bit
decoder, and PAL ?-like and-or-invert (AOI) in each
programmable logic cell.
many setup/hold and clock-to-out I/O speci ? cations,
and may provide reduced ground bounce for output
buses by allowing ? exible delays of switching output
buffers.
2
Lattice Semiconductor
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